Location & dates EMBL Heidelberg, Germany 3 - 6 Oct 2013
Deadlines Registration closed Abstract submission closed

FEI Munich GmbH, formerly TILL Photonics

Venue: EMBL Advanced Training Centre, Courtyard Room B

Workshop Sessions 1: 11:30 – 12:30

New tools for correlative light and electron microscopy

Ben Lich - FEI, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands

Combining information from light and electron microscopy adds significant value to biological imaging. The advantages of light microscopy are the possibilities of life cell imaging, sensitive fluorescent labeling and large overview. Electron microscopy provides the high resolution and the direct reference to the cellular ultrastructure, perfectly complementing the light (fluorescence) microscopical data. However, correlating information from both modalities still remains an experimental challenge. Due to the necessary sample preparation steps between (live cell) fluorescence imaging and electron microscopy, quick relocation to the area of interest, optimal contrast in both modalities and precise correlation between the two modalities is often hard to achieve.

FEI has recently introduced new solutions to overcome these experimental hurdles: CorrSight, a dedicated light microscopy system offering CLEM-specific functionality and automation of important workflow steps; MAPS, a software tool bridging the modalities to increase ease of use; and iCorr, a light microscope module integrated into the Tecnai family of transmission electron microscopes. These tools address different correlative workflows helping to optimize efficiency and data quality across the full range of CLEM experiments.

We will demonstrate how FEI's CLEM solutions are used in biological sample analysis where the fluorescence microscopy data is used to define the area of interest for analysis of the ultrastructure.

Using automated correlation methods contributes to high throughput analysis. Automated correlation in combination with the availability of large overview datasets yield improved understanding of the sample and time saving in the data acquisition and data analysis process




Workshop Sessions 2: 13:00 – 14:00

TIRF Microscopy - a fast, quantitative and easy to use solution

Eik Schumann, FEI Munich GmbH, Lochhamer Schlag 21, D-82166 Graefelfing, Germany

The iMIC, our digital-optical microscope, offers fast measurement at best sensitivity and minimal bleaching. Spinning disc confocal imaging, 2Photon, FRAP and FRET can be combined in one flexible setup and used on the same sample. Moreover FEI´s unprecedented solution for TIRF imaging makes the iMIC an even more valuable instrument.

TIRF is the way to get superior Z resolution using affordable laser and camera technology.

However, constant needs for realignment and inhomogeneous excitation have been drawbacks of this technology, especially for quantitative measurements.

Our motorized TIRF module brings the application to a next level, providing full control over penetration depth for different wavelengths, an automatically adjusted TIRF angle and a simple user interface.

A variety of acquisition protocols from single point, multi-point to 360° TIRF are available to truly meet all experimental needs.

Use your chance - join our workshop to gather deeper insight and hands on experience to FEI´s TIRF solution.